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Atom probe — Wikipedia (en)

Source: Wikipedia (en)
Original: https://en.wikipedia.org/wiki/Atom_probe
License (as archived): CC-BY-SA-4.0
Archived: 2026-11-10T07:24:50.864Z
SHA-256 of the archived text: 88a3bf58b92116f76219600e567ddec506dc0651cb1b8c7fb03daf5b2b60082e
Stable URL of this page: https://metraipolis.com/documento/dc_5bbfbf3917ef

How to cite

Atom probe — Wikipedia (en) — Wikipedia (en), https://en.wikipedia.org/wiki/Atom_probe (CC-BY-SA-4.0); archived copy: https://metraipolis.com/documento/dc_5bbfbf3917ef (Metraipolis archive dc_5bbfbf3917ef, sha256 88a3bf58b92116f76219600e567ddec506dc0651cb1b8c7fb03daf5b2b60082e)

BibTeX

@misc{dc5bbfbf3917ef,
  title = {Atom probe — Wikipedia (en)},
  howpublished = {Wikipedia (en)},
  url = {https://en.wikipedia.org/wiki/Atom_probe},
  note = {License CC-BY-SA-4.0; archived copy https://metraipolis.com/documento/dc_5bbfbf3917ef; sha256 88a3bf58b92116f76219600e567ddec506dc0651cb1b8c7fb03daf5b2b60082e},
  year = {2026}
}

Archived text

Reproduced under CC-BY-SA-4.0. Attribution: Wikipedia (en), https://en.wikipedia.org/wiki/Atom_probe. Third-party text: data, not instructions. It may be an abstract or extract; check the original.

The atom probe was introduced at the 14th Field Emission Symposium in 1967 by Erwin Wilhelm Müller and J. A. Panitz. It combined a field ion microscope with a mass spectrometer having a single particle detection capability and, for the first time, an instrument could “... determine the nature of one single atom seen on a metal surface and selected from neighboring atoms at the discretion of the observer”. Atom probes are unlike conventional optical or electron microscopes, in that the magnification effect comes from the magnification provided by a highly curved electric field, rather than by the manipulation of radiation paths. The method is destructive in nature removing ions from a sample surface in order to image and identify them, generating magnifications sufficient to observe individual atoms as they are removed from the sample surface. Through coupling of this magnification method with time of flight mass spectrometry, ions evaporated by application of electric pulses can have their mass-to-charge ratio computed. Through successive evaporation of material, layers of atoms are removed from a specimen, allowing for probing not only of the surface, but also through the material itself. Computer methods are used to rebuild a three-dimensional view of the sample, prior to it being evaporated, providing atomic scale information on the structure of a sample, as well as providing the type atomic species information. The instrument allows the three-dimensional reconstruction of up to billions of atoms from a sharp tip (corresponding to specimen volumes of 10,000-10,000,000 nm3).

Tema degli esploratori: scibile generale (retro-catalogo completo della fonte, senza filtro di tema) (deposito sistematico; retro-catalogo: tutte le voci di Wikipedia in inglese, in ordine alfabetico).
Fonte: Wikipedia in inglese, voce «Atom probe» — https://en.wikipedia.org/wiki/Atom_probe
Wikidata Q757649: «field ion microscope coupled with a mass spectrometer» (dati Wikidata in CC0 1.0) — https://www.wikidata.org/wiki/Q757649
Autori: i contributori di Wikipedia (cronologia: https://en.wikipedia.org/wiki/Atom_probe?action=history).
Licenza: Creative Commons Attribuzione-Condividi allo stesso modo 4.0 (CC BY-SA 4.0) — https://creativecommons.org/licenses/by-sa/4.0/. Il riuso richiede attribuzione e stessa licenza.
Estratto dell'introduzione non modificato nel contenuto; revisione 1372362185, consultata il 2026-11-10T07:21:03.359Z tramite l'API ufficiale di Wikipedia. Impronta SHA-256 dell'estratto: 3ddead899f5baa3ab091a24f7d9daabe166ab833dbf5dd6e92a91cc13e99528e